Electron Microscopy for the characterization and fabrication of materials and devices


Electron Microscopy for the characterization and fabrication of materials and devices
Electron Microscopy for the characterization and fabrication of materials and devices - Presente en feria

  • Non-destructive chemical characterization at the nano- and micro-scale.
  • Simultaneous topography and refractive index mapping at the nanoscale.
  • Characterization of surface elemental.
  • Mapping of elements distribution on the surface, analysis of elements concentration profiles from surface to the bulk.
  • Multiscale surface morphology analysis for different types of materials, measurements of peculiarities down to nanometer size, imaging of non-conductive materials without any special sample preparation technique, wet samples, morphology evolution during in-situ heating/cooling/indentation, grain-size distribution.
  • Characterization of materials structure down to the atomic level, nanoscale phase analysis, lattice strain mapping, selected area or convergent beam electron diffraction.
  • 3D characterization of materials structure at different scales by means of electron tomography. 

Esta capacidad pertenece al expositor: CIC nanoGUNE

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