Near-field Optical Microscopy for the optical characterization (ej. IR absorption, carrier density, etc.) of materials.


Near-field Optical Microscopy for the optical characterization (ej. IR absorption, carrier density, etc.) of materials.
Near-field Optical Microscopy for the optical characterization (ej. IR absorption, carrier density, etc.) of materials. - On show

  • Non-destructive chemical characterization at the nano- and micro-scale.
  • Simultaneous topography and refractive index mapping at the nanoscale.

This competence belongs to the exhibitor: CIC nanoGUNE

Other competences of this exhibitor

Coatings to functionalize materials

Coatings to functionalize materials

High-quality metallic, dielectric,...
Electron Microscopy for the characterization and fabrication of materials and devices

Electron Microscopy for the characterization...

Non-destructive chemical characterization...
Electrical, magnetic and mechanical characterisation of materials and devices

Electrical, magnetic and mechanical characterisation...

Electrical characterization at different...
Technologies

Technologies

1.     Detection...