Near-field Optical Microscopy for the optical characterization (ej. IR absorption, carrier density, etc.) of materials.

Near-field Optical Microscopy for the optical characterization (ej. IR absorption, carrier density, etc.) of materials. - Presente en feria

• Non-destructive chemical characterization at the nano- and micro-scale.
• Simultaneous topography and refractive index mapping at the nanoscale.

Esta capacidad pertenece al expositor: CIC nanoGUNE